1.The 10th Research Institute of China Electronics Technology Group Corporation； 2.The 58th Research Institute of China Electronics Technology Group Corporation
Abstract： We designed an RF microsystem by using silicon-based three-dimensional heterogeneous integration process to meet the requirements of high performance and miniaturization of RF modules. To fully evaluate the potential reliability risk of the microsystem in the early stage of design, we establish a multi-physics integrated simulation process for this RF microsystem according to the process characteristics and the multi-physics coupling phenomenon. Then we analyze the electro-thermal and thermal-mechanical coupling processes involved, predict the thermal and mechanical characteristics of the product under working conditions, provide targeted guidance for the design process, and avoid reliability risks in advance, so as to effectively improve the success rate of one-time design.
Key words : silicon-based 3D heterogeneous integrated RF microsystem；multi-physics coupling simulation；electro-thermal coupling；thermal-mechical coupling
